FEI Co.

Description

Geosciences Mapping mineralogy & textures at the micron-scale to reveal Earth's geological history Geoscientists have been examining and describing rocks for over 150 years, ever since the advent of light microscopes and petrographic thin-sections in the 1850's. The goal today remains much the same. By making detailed observations of a rock's mineralogy and microstructure, it is possible to unravel its history.

About Nicki: Nicki Watson has over twenty years experience working in microscopy. Her specialized expertise is electron microscopy and she offers special assistance to researchers needing this technique. Nicki has been with the Whitehead Institute since 1998. She first worked in electron microscopy as an undergraduate at San Diego State University. Following graduation, Nicki spent two years working as a clinical electron microscopist at the VA Medical Center in La Jolla, California then spent six years working with Drs.

A Global Shift in Automotive Part Cleanliness Monitoring Quality-conscious manufacturers find it increasingly necessary to ensure the critical cleanliness of their parts and processes. Issues associated with component contamination can cause both long- and short-term limitations in vehicle performance. Before they can minimize performance issues, however, manufacturers need a system to specify the contaminants involved and the source of the contamination.

Use of Information The purpose of collecting information is to enable FEI to deliver the requested services or products, to complete a transaction initiated by you, to consider you for a job opening or scholarship, to contact you about a requested service, if necessary, and to provide related information that may be of interest to you. During the course of completing a transaction initiated by you, FEI may provide your contact or other information to a third party fulfillment partner or sales agent.

At FEI we believe that the path to success for our customers lies in the intelligent integration of hardware and software. As an extension to our already popular and powerful ‘Auto Slice & View’ software, we have integrated DualBeam post-processing in our updated software suites ‘Amira for FEI Systems’ and ‘Avizo for FEI Systems’. This 3D post-processing and visualization integration is unique in the electron microscopy world and enables our customers to obtain quantitative data fast and seamlessly.

Companies nearby