Semetrol

Description

SEMETROL was founded in 2005 to develop and market advanced semiconductor characterization and analysis systems. The characterization methods include deep level transient spectroscopy (DLTS), current-voltage-temperature (IVT), capacitance-voltage profiling (CV), photocapacitance (PC), thermal admittance spectroscopy (TAS), and other related methods.

Daniel Johnstone formed Semetrol after gaining several years of experience in characterization and analysis with a broad range of semiconductor materials. Professional preparation includes a PhD in Engineering Physics, Master's Degree in Electrical Engineering, and Bachelor's Degrees in Electrical Engineering and in Ceramic Engineering.

The data acquisition program and analysis programs are the result of several years of use in providing commercial services. There are also several utility programs included that have proven essential in validating device suitability, measurement conditions, and results.

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